Showing results: 76 - 90 of 405 items found.
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MA 2111/D/H/S-5 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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2112/D/H/S-7/HG/Pylon -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
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MA 2112/D/H/S-7 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 11,30 kg
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MA 2112/D/H/S-7/GR228x-15/7 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,30 kg
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MA 2112/D/H/S-7/GR228x-15/15 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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MA 2111/D/H/S-5/HG -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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MA 2112/D/H/S-7/HG/KT-ITA-21 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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MA 2109/D/H/S-5 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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MA 2112/D/H/S-7/GR2270/71 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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RF100 -
Laplace Instruments Ltd.
The RF100 probe set consists of a passive E field probe and H field probe, BNC adaptor and carry case. The output is via a BNC socket. These are general purpose probes which are ideal for use in conjunction with an EMC measuring system. They are sensitive to sources in close proximity, but are insensitive to background signals. This makes them ideal for the identification of emission frequencies in noisy environments... thus making measurements easier and quicker. The proximity requirement also enables sources to be located and the exit route identified.
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IT Concepts llc
Documentation Unit + High Power Light Source + probe incl. Control and lens The modular systems can be combined and endlessly expandable.
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Multigauge 5600 -
Tritex
On screen user information such as probe frequency and remaining battery. Colour LCD display. Easy to use keypad and menu system.
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Jandel Engineering Limited
Jandel probe heads are manufactured solely by Jandel Engineering Limited and there is one to fit all mountings and systems known to us.
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UF3000EX-e -
CSE Co.,Ltd
Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.
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ICR E150 -
Langer EMV-Technik GmbH
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.